The HORIBA Scientific ICP-OES spectrometers with their unique design provide high performance to your laboratory for the most challenging applications.
Dynamic Light Scattering
Industry's widest range and highest precision measurement instrument for Nanoparticle characterization.
Confocal Raman Spectrometers
HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA Scientific has pioneered systems for Raman spectroscopy, designing and manufacturing them for over four decades.
Spectroscopic ellipsometry is a surface sensitive, non-destructive, and non-intrusive optical metrology technique widely used to determine thin film thickness and optical constants (n, k).
An abundance of analytical functions and excellent, stable control techniques provide fast, high precision analysis of materials ranging from micro-quantity samples to high-concentration samples.
Particle Size Analyzer
HORIBA designs, manufactures, and supplies state of the art particle characterization instruments.
HORIBA Scientific provides spectrometers for the surface, depth profile and bulk analysis of both conductive and non-conductive samples with Radio Frequency Glow Discharge sources (RF-GD-OES).
Sulfur in Oil
Today's world is facing many environmental problems. In order to prevent harmful pollution high precision analysis technology with a high degree of sensitivity, precision and repeatability gains importance.
General purpose X-ray diffractometer DRON-8 with vertical theta - theta goniometer and sample horizontal position enables to perform X-ray diffraction analysis of phase composition, structural state and orientation of heavy large-size and irregular-form samples.
Micro XRF Analyzer
The XGT X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size.